Apparatus for measuring anisotropy of light emitted from the sam

Details Apparatus for measuring anisotropy of light emitted from the sam Apparatus for measuring anisotropy of light emitted from the sam

1984-03-27

1986-05-06

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

2504581, 356367, G01J 3443, G01N 2164

Patent

active

045868204

ABSTRACT:
An apparatus for measuring anisotropy of light emitted from the sample, in which photodetectors are each disposed by either side of the sample and TACs are connected to the abovesaid apparatus each correspondingly to one photodetector so that a vertical polarized component and a horizontal one of light emitted from the sample can be measured at the same time for enabling analysis operation in a short period of time and measurement in high precision.

REFERENCES:
patent: 4074939 (1978-02-01), Rabl
patent: 4419583 (1983-12-01), Noeller
Minami et al., Japanese Journal of Applied Physics, vol. 14, Suppl. 14-1, 1975, pp. 39-43.
Kelly et al., Analytical Chemistry, vol. 48, No. 6, May 1976, pp. 846-856.
Leskovar et al., Rev. Sci. Instrum., vol. 47, No. 9, Sep. 1976, pp. 1113-1121.
Atkinson, J. Phys. E., Sci. Instrum. (G.B.), vol. 10, No. 5, May 1977, pp. 482-484.

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