Optics: measuring and testing – Photometers – Integrating spheres
Patent
1998-10-27
1999-09-21
Pham, Hoa Q.
Optics: measuring and testing
Photometers
Integrating spheres
356446, 250228, G01N 2147
Patent
active
059561335
ABSTRACT:
A reflection characteristic measuring apparatus is provided with a hollow integrating sphere. The integrating sphere is formed with four apertures: a sample aperture where a sample to be measured is placed; a first illumination aperture for allowing light to enter the sphere from a first illuminator; a second illumination aperture for allowing light to enter the sphere from a second illuminator; and a measurement aperture for allowing light to exit from the sphere. A photoreceptor receives light reflected from the sample that exits the measurement aperture. A reflection characteristic calculator is used to for calculating first and second reflection characteristics of the sample based on the light received by the photoreceptor. A corrector is used to correct the calculated first and second reflection characteristics.
REFERENCES:
patent: 4932779 (1990-06-01), Keane
patent: 5369481 (1994-11-01), Berg et al.
patent: 5384641 (1995-01-01), Imura
patent: 5859709 (1999-01-01), Imura
Minolta Co. , Ltd.
Pham Hoa Q.
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