Apparatus for measuring a reflection characteristic

Details Apparatus for measuring a reflection characteristic Apparatus for measuring a reflection characteristic

1998-10-27

1999-09-21

Pham, Hoa Q.

Optics: measuring and testing

Photometers

Integrating spheres

356446, 250228, G01N 2147

Patent

active

059561335

ABSTRACT:
A reflection characteristic measuring apparatus is provided with a hollow integrating sphere. The integrating sphere is formed with four apertures: a sample aperture where a sample to be measured is placed; a first illumination aperture for allowing light to enter the sphere from a first illuminator; a second illumination aperture for allowing light to enter the sphere from a second illuminator; and a measurement aperture for allowing light to exit from the sphere. A photoreceptor receives light reflected from the sample that exits the measurement aperture. A reflection characteristic calculator is used to for calculating first and second reflection characteristics of the sample based on the light received by the photoreceptor. A corrector is used to correct the calculated first and second reflection characteristics.

REFERENCES:
patent: 4932779 (1990-06-01), Keane
patent: 5369481 (1994-11-01), Berg et al.
patent: 5384641 (1995-01-01), Imura
patent: 5859709 (1999-01-01), Imura

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