Apparatus for measuring a gradient of a surface

Details Apparatus for measuring a gradient of a surface Apparatus for measuring a gradient of a surface

1980-02-07

1981-09-15

Punter, William H.

Optics: measuring and testing

By polarized light examination

With light attenuation

356371, 356445, G01B 1124, G01B 1126

Patent

active

042894000

ABSTRACT:
An apparatus for continuously measuring a gradient of a curved surface at a number of different points thereon is disclosed in which a laser beam reflected at the point to be measured on the surface makes a beam spot on a photo sensor. The photo sensor follows the beam spot while the center of the beam spot and the center of the photo sensor coincide. The displacement between the beam spot from the point subjected to measurement and the beam spot from a reference point on the surface of the photo sensor is proportional to the gradient at the point subjected to measurement. The photo sensor is, for example, a differential type which comprises four photo diodes. The numerical control table is used to determine the positional relationship of the point to be measured with respect to the laser beam and an X-Y recorder is used to follow the beam spot.

REFERENCES:
patent: 3614238 (1971-10-01), Stites
patent: 3857637 (1974-12-01), Obenreder
patent: 3909131 (1975-09-01), Waters
Wong; G. S. K., "A Sensitive Null-Setting Angle Detector", Jr. of Physics E(G.B.), vol. 4, 3-1971, pp. 195-197.

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