Apparatus for measuring a beam width D.sub..sigma.x along a tran

Details Apparatus for measuring a beam width D.sub..sigma.x along a tran Apparatus for measuring a beam width D.sub..sigma.x along a tran

1995-02-23

1996-12-24

Evans, F. L.

Optics: measuring and testing

Lamp beam direction or pattern

G01J 100

Patent

active

055877869

ABSTRACT:
The present invention relates to an apparatus and a method upon which the apparatus is based for direct optical measurement of first and second moments (variance) of two-dimensional continuous-wave optical beam irradiance distributions. The apparatus and method are based on an optical filter having a spatially-varying transmittance or reflectance profile described by a one-dimensional truncated parabolic function. The light power transmitted through or reflected by the optical filter is measured by a photodetector as the optical filter travels horizontally across the beam irradiance profile. The variance is obtained from the ratio of the peak signal given by the photodetector normalized to the signal corresponding to the total optical power of the unobstructed optical beam. The first moment in a fixed reference frame is given by the horizontal position of the region of peak transmittance/reflectance of the filter when the maximum signal is measured.

REFERENCES:
patent: 3809478 (1974-05-01), Talbot
patent: 4874939 (1989-10-01), Nishimoto et al.
Fleischer et al., "Gaussian Beam Profiling: How and Why", Laser & Optronics, May 1987, pp. 61-64.
Stafford, "Measuring Diameter of a Laser Beam", IBM Technical Disclosure Bulletin, vol. 17, No. 11, Apr. 1975, pp. 3197-3198.

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