Apparatus for measurement optical characteristic of a...

Thermal measuring and testing – Temperature measurement – Combined with diverse art device

Reexamination Certificate

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C374S133000, C374S208000, C374S005000, C348S189000, C348S191000, C349S072000, C345S030000

Reexamination Certificate

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10905763

ABSTRACT:
An ambient temperature control apparatus used for measuring ambient temperature. The apparatus has a bottom plate, a panel fitting apparatus, an external mask, and a temperature control device. The panel fitting apparatus is disposed on the bottom plate and is suitable for use to fix a liquid crystal panel. The external mask is detachably mounted on the bottom plate to form a cavity, in which the panel fitting apparatus and the liquid crystal panel are enclosed. The external mask includes at least a window allowing the photometer to measure the liquid crystal panel therefrom. The temperature control device mounted to the external mask is suitable to control the temperature variation of the cavity.

REFERENCES:
patent: 4119842 (1978-10-01), Hayden et al.
patent: 4642529 (1987-02-01), Penn
patent: 4789224 (1988-12-01), Bougsty
patent: 5371537 (1994-12-01), Bohan et al.
patent: 5572444 (1996-11-01), Lentz et al.
patent: 5744819 (1998-04-01), Yamamoto et al.
patent: 5764209 (1998-06-01), Hawthorne et al.
patent: 5766694 (1998-06-01), West et al.
patent: 6177955 (2001-01-01), Downen et al.
patent: 6232954 (2001-05-01), Rozzi
patent: 6362849 (2002-03-01), Caisey-Bluteau et al.
patent: 6388722 (2002-05-01), Yoshii et al.
patent: 6525816 (2003-02-01), Aastuen et al.
patent: 6606116 (2003-08-01), Poynter
patent: 6885409 (2005-04-01), Stephenson et al.
patent: 7180530 (2007-02-01), Whittington et al.
patent: 2003/0193564 (2003-10-01), Jenkins
patent: 2005/0146659 (2005-07-01), Ishii et al.

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