Apparatus for manufacturing an electronic device, method of...

Adhesive bonding and miscellaneous chemical manufacture – Surface bonding means and/or assembly means therefor – Automatic and/or material-triggered control

Reexamination Certificate

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Details

C156S269000, C156S270000, C156S302000, C156S305000, C156S522000, C156S559000, C438S108000, C438S111000, C438S118000, C438S123000

Reexamination Certificate

active

07017636

ABSTRACT:
A mounting zone and a reflow zone are arranged in parallel between a loader and an unloader, and mounting and reflow processes are performed simultaneously.

REFERENCES:
patent: 3816215 (1974-06-01), Wethington
patent: 4483810 (1984-11-01), Bunk et al.
patent: 6051093 (2000-04-01), Tsukahara
patent: 6323454 (2001-11-01), Mitsuhashi
patent: 58-217475 (1983-12-01), None
patent: 06-045405 (1994-02-01), None
patent: 06-063733 (1994-03-01), None
patent: 06-163646 (1994-06-01), None
patent: 06-310849 (1994-11-01), None
patent: 10-135278 (1998-05-01), None
patent: 11-163025 (1999-06-01), None
patent: 2000-246693 (2000-09-01), None
patent: 2000-332063 (2000-11-01), None
patent: 2001-351951 (2001-12-01), None
patent: 2002-043370 (2002-02-01), None
Two communications from Japanese Patent Office re: related applications.
Communication from Japanese Patent Office re: counterpart application.
Communication from Japanese Patent Office regarding related application.

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