Electricity: measuring and testing – Magnetic – With temperature control of material or element of test circuit
Patent
1990-11-08
1992-07-28
Strecker, Gerard R.
Electricity: measuring and testing
Magnetic
With temperature control of material or element of test circuit
324219, 324226, 324227, 324240, 324241, 324248, 324262, G01R 3312, G01R 33035, G01N 2772, G21C 17003
Patent
active
051343681
ABSTRACT:
On the basis of a finding that a magnetic hysteresis of a metal material, among magnetization characteristics changing with secular degradation of the metal material, shows a clear correspondence with the degree of degradation of the metal material, a change in such a magnetization characteristic is measured to estimate the degree of secular degradation of the metal material. In a typical embodiment, a superconducting quantum interference device is used to detect the magnetization characteristic of a measuring object. According to the present invention, the degree of embrittlement of a metal material used in an environment of high temperatures can be quickly detected in a non-destructive fashion so that the danger of brittle fracture of the metal material can be reliably prevented.
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Nave et al.; Micromagnetic susceptometer, Rev. Sci. Instrum., vol. 51, No. 5, May 1980, pp. 591-596.
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Enomoto Kunio
Hasegawa Kunio
Hayashi Makoto
Otaka Masahiro
Shimizu Tasuku
Hitachi , Ltd.
Strecker Gerard R.
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