Apparatus for inspecting the surface of a material

Details Apparatus for inspecting the surface of a material Apparatus for inspecting the surface of a material

1987-01-27

1988-08-16

Boudreau, Leo H.

Image analysis

Histogram processing

For setting a threshold

358106, 358107, G06K 900

Patent

active

047649690

ABSTRACT:
An apparatus for inspecting the surface of a material having a first inspection section for inspecting the wide surface condition of a material with an analysis, a second inspection section for inspecting specific position's conditions of the surface of the material with finer analysis than that of the first inspection section, and a controller for controlling an inspecting position of the second inspection section to inspect an unusual position after the first inspection section finds the unusual position.

REFERENCES:
patent: 4589140 (1986-05-01), Bishop et al.
patent: 4593406 (1986-06-01), Stone
patent: 4692943 (1987-09-01), Pietzsch et al.

Affiliated with

Also associated with

Rating

Apparatus for inspecting the surface of a material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for inspecting the surface of a material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for inspecting the surface of a material will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-604889