Apparatus for inspecting the operation of integrated circuit dev

Electricity: measuring and testing – Plural – automatically sequential tests

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324158F, 439 70, G01R 3102, H01R 13635

Patent

active

048167517

ABSTRACT:
The present invention is concerned with an apparatus for inspecting the operation of a number of integrated circuit devices mounted on a printed circuit board. The apparatus includes a common lead-out connector unit that may be connected to and used with any one of a plurality of fitting units adapted for separately fitting to a plurality of the integrated circuit devices having a variable number of lead terminals for taking out signals at the integrated circuit devices. The apparatus makes it possible to take out signals simultaneously at all of the lead terminals of the integrated circuit devices for inspecting the operation of these devices for elevating the inspection efficiency of the integrated circuit devices having a variable number of the lead terminals.

REFERENCES:
patent: 3701077 (1972-10-01), Kelly, Jr.
patent: 3870953 (1975-03-01), Boatman et al.
patent: 4195258 (1980-03-01), Yen
patent: 4230985 (1980-10-01), Matrone et al.
Northrop et al; "Isolation . . . "; IBM Tech. Disc. Bull.; vol. 3; No. 1; Jun. 1960; p. 7.
Defler, Jr., F. J.; "Sending . . . "; Microcomputing; Feb. 1984; pp. 16 19, and 20.

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