Apparatus for inspecting the molded case of an IC device

Details Apparatus for inspecting the molded case of an IC device Apparatus for inspecting the molded case of an IC device

1987-02-27

1990-11-06

Moore, David K.

Image analysis

Histogram processing

For setting a threshold

358106, 382 22, G06K 900

Patent

active

049691996

ABSTRACT:
An inspection apparatus includes a device which prepares a circumscribing line of an object to be inspected from pictured image information of the inspected object, and a device which judges the quality of the inspected object from the image information on a portion of the inspected object defined by the circumscribing line prepared by the circumscribing line preparation device. The inspection apparatus may include a device which detects an inclination angle of a nondefective article with respect to a predetermined reference line from pictured image information of the nondefective article, said nondefective article serving as a reference which has the same configuration as the inspected object and registers the inclination angle as a reference angle, and a device for inspecting the quality of the inspected object based on the reference angle in the reference angle detecting and registering device. Moreover, the inspection apparatus may include a device which memorizes pictured image information of the object to be inspected by quantizing it, a device which rotates the quantized image information of the inspected object that is memorized in the quantization and memory device, and a device which memorizes the quantized image information rotated by the image information rotation device after making it multi-valued.

REFERENCES:
patent: 4334241 (1982-06-01), Kashioka et al.
patent: 4525747 (1985-06-01), Sakai et al.
patent: 4644410 (1987-02-01), Schlichtig
patent: 4670788 (1987-06-01), Ozaki
patent: 4696047 (1987-09-01), Christian et al.
patent: 4737845 (1988-04-01), Susuki et al.

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