Apparatus for inspecting surface of a face plate for a cathode r

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions

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Details

356239, 356445, 250548, 250572, 1984633, 1983451, G01N 2100, B65B 3700

Patent

active

053050800

ABSTRACT:
An inspection apparatus is provided to permit an inspector to easily inspect a face plate which has passed through a grinding process for flaws, an alien substance or an unground portion on the face plate surface. The apparatus includes a gate conveyor on which the face plate is conveyed. When the face plate is stopped on the gate conveyor, the sides of the face plate are engaged via padded piston rods and the gate conveyor swung open so as to permit the engaged face plate to be rotated for inspection purposes. Light sources may be positioned above and below the gate conveyor to aid in the inspection of a face plate.

REFERENCES:
patent: 2785785 (1957-03-01), Macaluso
patent: 3013459 (1961-12-01), Coleman
patent: 3072095 (1963-01-01), Keessen et al.
patent: 3353652 (1967-11-01), Fellner, Jr.
patent: 4109781 (1978-08-01), Moons
patent: 4331228 (1982-05-01), Galarowic
patent: 4463845 (1984-08-01), Harris
patent: 4585343 (1986-04-01), Schave et al.
patent: 5024315 (1991-06-01), Ward

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