Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1992-09-04
1995-01-24
Nguyen, Vinh
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324 731, G01R 106
Patent
active
053845315
ABSTRACT:
An apparatus for inspecting characteristics of semiconductor chips has a loading device for loading semiconductor chips onto a testing tray positioned by a servo motor, a CCD camera, an upper contact fixture controlled in X, Y, and .THETA. directions, and a lower contacting fixture driven by a cylinder. Positioning of the contact probe pins is accurately achieved by pattern processing and fully automated inspection is made possible. The apparatus is equipped with the same number of contact probe pins as the number of inspection points of a semiconductor chip; hence, all the cells of a semiconductor chip can be inspected as a unit. Therefore, the inspection can be made in a mode similar to practical conditions that occur after final assembly of the semiconductor chip.
REFERENCES:
patent: 4103232 (1978-07-01), Sugita et al.
patent: 4818169 (1989-04-01), Schram, deceased et al.
patent: 4907931 (1990-03-01), Mallory et al.
patent: 4938654 (1990-07-01), Schram
patent: 5105147 (1992-04-01), Karasikov et al.
patent: 5148100 (1992-09-01), Sekiba
Ijichi Toshiya
Yamazaki Mitsuru
Yashiro Masakazu
Mitsubishi Denki & Kabushiki Kaisha
Mitsubishi Electrical Engineering Co. Ltd.
Nguyen Vinh
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