X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-11-14
2006-11-14
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S002000, C378S098600, C250S358100
Reexamination Certificate
active
07136453
ABSTRACT:
Apparatus (1) for imaging an object (4) on the remote side of a barrier (6). The apparatus has source means (2) for scanning the object (4) through the barrier (6) with radiation and mask means (8) having at a least one radiation transparent area wherein the radiation from the source is masked thereby to project on to the object (4) at least one scanning beam of radiation. The apparatus (1) also has detector means (10) for detecting radiation reflected from any scanned point on the object (4) and image generation means for generating an image of the object (4) from the detected radiation.
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U.S. Appl. No. 60/112,102 —Grodzins, Lee—filed Dec. 14, 1998.
Burrows John David
Carter Tony
Dermody Geraint Spencer
Jupp Ian David
Pleasants Ian Blair
Glick Edward J.
Kilpatrick & Stockton LLP
Russell Dean W.
The Secretary of State for Defence
Yun Jurie
LandOfFree
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