Measuring and testing – Surface and cutting edge testing – Roughness
Patent
1995-06-07
1998-04-28
Noland, Thomas P.
Measuring and testing
Surface and cutting edge testing
Roughness
250306, G01B 734
Patent
active
057447047
ABSTRACT:
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.
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Hu Jun
Ogletree D. Frank
Salmeron Miguel
Xiao Xudong
Martin Paul R.
Noland Thomas P.
Ross Pepi
The Regents University of California
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