Measuring and testing – Probe or probe mounting
Patent
1998-05-22
1999-07-27
Raevis, Robert
Measuring and testing
Probe or probe mounting
G01N 100
Patent
active
059293500
ABSTRACT:
A universal connector apparatus for probes used for measuring one or more parameters of molten material which identifies a probe type is provided. The probes each include a probe connector having a plurality of contacts arranged in a contact configuration. The universal connector is adapted to be connected to a drop mechanism, and includes a receptacle which is complementary to and adapted to receive a probe connector. A plurality of contacts are located in the receptacle and are positioned to provide electrical connections with the probe connector contacts. An identifying device is electrically connected to the contacts in the receptacle to detect short circuits between the contacts.
REFERENCES:
patent: 5168764 (1992-12-01), Falk
patent: 5610346 (1997-03-01), Stelts
Clauss, Jr. Harry G.
Corey Jeffrey W.
Heraeus Electro-Nite International
Raevis Robert
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