Measuring and testing – Probe or probe mounting
Patent
1994-08-17
1997-06-10
Dougherty, Elizabeth L.
Measuring and testing
Probe or probe mounting
G01D 2100
Patent
active
056378149
ABSTRACT:
An apparatus for holding a rod-shaped device in an abutting relationship with a workpiece comprises a bar with a bias structure coupled with the bar and the workpiece. The bar has an aperture which is proportioned to pass the rod-shaped device when the bar member is in a first orientation with respect to an axis about which the device is oriented, and to effect binding engagement between the bar and the rod-shaped device when the bar is in a second orientation with respect to the axis. The bias structure urges the bar to the second orientation.
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patent: 5471887 (1995-12-01), Laub
Timmons Tom
Yelverton Mark
Advanced Micro Devices
Dougherty Elizabeth L.
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