Apparatus for handling electronic components and method for...

Details Apparatus for handling electronic components and method for... Apparatus for handling electronic components and method for...

2005-12-06

2005-12-06

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06972581

ABSTRACT:
A handler1is provided with an inner chamber104containing inside thereof heat sinks40of pushers30, a temperature adjusting unit91for controlling the atmosphere temperature inside the inner chamber104, a test chamber102containing inside thereof sockets40located on the test head5and the inner chamber104, and a temperature adjusting unit90for controlling the atmosphere temperature inside the test chamber102. With such a handler1, the temperature control can be conducted so that the temperature of electronic components is brought close to the set temperature of the target test.

REFERENCES:
patent: 5528161 (1996-06-01), Liken et al.
patent: 6445203 (2002-09-01), Yamashita et al.
patent: 6522127 (2003-02-01), De Fleury et al.
patent: 6838897 (2005-01-01), Kim et al.
patent: A-2000-171520 (2000-06-01), None
patent: A-2001-004693 (2001-01-01), None

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