Apparatus for generating timing signals used for testing ICs hav

Details Apparatus for generating timing signals used for testing ICs hav Apparatus for generating timing signals used for testing ICs hav

1986-09-29

1988-10-04

Zache, Raulfe B.

Boots, shoes, and leggings

307269, 371 27, G01R 3128, H03L 700

Patent

active

047759542

ABSTRACT:
A timing signal generating apparatus is used for testing ICs, particularly ICs having more than two enable input terminals. Data representative of the time of occurrence of a timing signal with respect to a reference signal is stored in a memory. In a first cycle, data is combined by an arithmetic unit with data stored in another memory. The latter data represents a predetermined desired variation in the time of occurrence of the timing signal. The output of the arithmetic unit is then stored in a temporary memory and combined with the data representative of the predetermined variation in time of occurrence of the timing signal. The time of occurrence of the timing signal is determined by the output of the arithmetic unit. A timing signal is thus produced over an almost arbitrary range of delays with respect to the reference signal.

REFERENCES:
patent: 3952253 (1976-04-01), DeVolp et al.
patent: 4131855 (1978-12-01), Hamagawa
patent: 4306190 (1981-12-01), Beckwith et al.
patent: 4450560 (1984-05-01), Conner
patent: 4523289 (1985-06-01), Soma et al.
patent: 4555663 (1985-11-01), Shimizu
patent: 4573175 (1986-02-01), Cressey et al.
patent: 4584683 (1986-04-01), Shimizu
patent: 4680479 (1987-07-01), Alonso
patent: 4719375 (1989-01-01), Martin

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