Apparatus for gauging the texture of a conducting surface

Details Apparatus for gauging the texture of a conducting surface Apparatus for gauging the texture of a conducting surface

1976-09-15

1978-07-25

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

G01R 2726

Patent

active

041032268

ABSTRACT:
A capacitance gauging apparatus is described for monitoring the texture or flatness of a conductive surface. Conductive plate members, resiliently supported on a flexible substrate, provide a probe to measure the texture of a surface to be monitored, the surface itself forming the other plate of a capacitor. The capacitance probe is electrically energized and connected to a monitoring circuit. As the insulated probe rests on the conducting surface, the resulting capacitance changes the frequency of the monitoring circuit. The monitoring circuitry counts the pulses within a period, the number of pulses being proportional to the surface texture, i.e., the higher the number, the coarser the surface texture, and conversely. The period of counting is set such that the surface texture may be displayed directly in microinches or micrometers.

REFERENCES:
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patent: 2721976 (1955-10-01), Wojciechowski
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patent: 3387776 (1968-06-01), Stillwell et al.
patent: 3400331 (1968-09-01), Harris
patent: 3426272 (1969-02-01), Griffin
patent: 3519922 (1970-07-01), Nash et al.
patent: 3678378 (1972-07-01), Trott et al.
patent: 3761810 (1973-09-01), Fathauer
patent: 3764899 (1973-10-01), Peterson et al.
patent: 3805150 (1974-04-01), Abbe

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