Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-28
2005-06-28
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S760020, C324S1540PB
Reexamination Certificate
active
06911836
ABSTRACT:
A chip testing system with improved thermal performance. In a preferred embodiment, a nest assembly of a chip testing apparatus includes tooling balls and a fitted frame for improving alignment of a coldplate and a chip surface. In preferred embodiments, the coldplate is of unibody design. Thermal performance is also improved by balancing the forces exerted on the coldplate using an adjustable hose mounting bracket. The bracket allows the forces exerted by the hoses on the coldplate to be adjusted so they balance and cancel other unwanted forces on the cold plate.
REFERENCES:
patent: 5841634 (1998-11-01), Visser
patent: 6617868 (2003-09-01), Needham
Cannon Lonnie J.
Corbin, Jr. John Saunders
Gardell David Lewis
Garza Jose Arturo
Kutner Jeffrey Frank
McBurney Mark E.
Tang Minh N.
Yee Duke W.
Yociss Lisa L. B.
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