Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2004-09-16
2008-10-21
Le, Brian Q (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S199000
Reexamination Certificate
active
07440618
ABSTRACT:
A rather expanded binary image and a rather blurry binary image are generated from a multiple-valued image. A ruled line candidate area is extracted from the rather expanded binary image, and the extracted ruled line candidate area is verified using the rather blurry binary image.
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Fujimoto Katsuhito
Naoi Satoshi
Ohara Atsuko
Fujitsu Limited
Le Brian Q
Staas & Halsey , LLP
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