Apparatus for extracting rules line from multiple-valued image

Image analysis – Pattern recognition – Feature extraction

Reexamination Certificate

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C382S199000

Reexamination Certificate

active

07440618

ABSTRACT:
A rather expanded binary image and a rather blurry binary image are generated from a multiple-valued image. A ruled line candidate area is extracted from the rather expanded binary image, and the extracted ruled line candidate area is verified using the rather blurry binary image.

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Japanese Patent Office Notice of Rejection Grounds, mailed Oct. 3, 2006, and issued in corresponding Japanese Patent Application No. 2001-064194.
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