Apparatus for extracting pattern features

Details Apparatus for extracting pattern features Apparatus for extracting pattern features

1998-11-05

2000-05-02

Sugarman, Scott J.

Optical: systems and elements

Collimating of light beam

359196, G02B 2730

Patent

active

060579676

ABSTRACT:
An apparatus is presented for extracting configurational features of an object formed by a number of surfaces with a two-dimensional laser pattern. Changes in the shape can be tracked, and speedy three-dimensional measurements are made possible in a small memory area without requiring parameter adjustment. The device comprises a two-dimensional laser pattern generating device 61 which projects laser light in a desired two-dimensional pattern configuration, a three-dimensional position calculating device 62 which synchronizes the timing of the laser light illumination with the timing of the detection of two-dimensional points. Three-dimensional coordinates of a surface point are rapidly calculated, then the surface parameters are determined by the three-dimensional positions of a number of points (three points or more). A pattern information generating device 63 varies the pattern to be projected in accordance with the surface parameters so obtained, and a pattern recognition device 64 controls the movements of a robot in accordance with variations in configuration based on the edge lines, vertexes and other features determined by a number of plane surfaces.

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Nurre et al., "Encoded Moire Inspection Based on a Computer Solid Model," IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 14, No. 12, pp. 1214-1218, Dec. 1992.

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