Apparatus for examining samples by electron emission

Details Apparatus for examining samples by electron emission Apparatus for examining samples by electron emission

1983-10-12

1987-03-31

DeMeo, Palmer C.

Electric lamp and discharge devices

Geiger-mueller type

2504421, H01J 4700, G21K 510

Patent

active

046545565

ABSTRACT:
The invention relates to the examination of samples which, by thermal or photon excitation, are able to emit electrons. These electrons are detected and located by a counter incorporating a cathode forming a mesh network. Pointed anodes coincide with the axes of the meshes. The enclosure of the apparatus is sealed by the sample and its excitation means. The invention can be used in dosimetry or in the checking of surface states.

REFERENCES:
patent: 2692948 (1954-10-01), Lion
patent: 3852595 (1974-12-01), Aherth
patent: 4033904 (1977-07-01), Gerlach et al.
patent: 4280075 (1981-07-01), Comby et al.
patent: 4486659 (1984-12-01), Turner
"Le Vide", vol. 35, No. 203, Sep./Oct. 1980.
"Metallurgical Transactions", vol. 8A, Jun. 1977.

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