Apparatus for evaluating the quality of a lapping plate

Abrading – Precision device or process - or with condition responsive... – Computer controlled

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C451S008000, C451S011000, C451S029000, C451S030000, C451S387000

Reexamination Certificate

active

08047894

ABSTRACT:
Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, an information receiver receives information while the lapping plate is being used to lap a slider. The information indicates the quality of a lapping plate. A quality determiner that evaluates the quality of the lapping plate based on the information while the lapping plate is being used to lap the slider.

REFERENCES:
patent: 5632669 (1997-05-01), Azarian et al.
patent: 5722155 (1998-03-01), Stover et al.
patent: 5735036 (1998-04-01), Barr et al.
patent: 5772493 (1998-06-01), Rottmayer et al.
patent: 6163954 (2000-12-01), Nakagawa
patent: 6170149 (2001-01-01), Oshiki et al.
patent: 6196897 (2001-03-01), Suto et al.
patent: 6347983 (2002-02-01), Hao et al.
patent: 6497798 (2002-12-01), Rabinski et al.
patent: 6531399 (2003-03-01), Kojima et al.
patent: 6585559 (2003-07-01), Griffin et al.
patent: 6609948 (2003-08-01), Fontana et al.
patent: 6679760 (2004-01-01), Fukuroi et al.
patent: 6760197 (2004-07-01), Boutaghou et al.
patent: 6949004 (2005-09-01), Broussalian et al.
patent: 7014530 (2006-03-01), Kasiraj et al.
patent: 7100266 (2006-09-01), Plumer et al.
patent: 2002/0012204 (2002-01-01), Boutaghou et al.
patent: 2002/0063984 (2002-05-01), McClellan et al.
patent: 2002/0126421 (2002-09-01), Takahashi et al.
patent: 2003/0026046 (2003-02-01), Yamakura et al.
patent: 2003/0200041 (2003-10-01), Church et al.
patent: 2004/0027732 (2004-02-01), Kelly et al.
patent: 2004/0088137 (2004-05-01), Sermon et al.
patent: 2004/0097173 (2004-05-01), Crawforth et al.
patent: 2004/0176013 (2004-09-01), Church et al.
patent: 2005/0059323 (2005-03-01), Beaucage et al.
patent: 2005/0068696 (2005-03-01), Chau et al.
patent: 2005/0070206 (2005-03-01), Kasiraj et al.
patent: 2005/0191946 (2005-09-01), Beaucage et al.
patent: 2006/0067004 (2006-03-01), Cyrille et al.
patent: 63052968 (1988-03-01), None
patent: 3049004 (1991-03-01), None
patent: 10269530 (1998-10-01), None
patent: 2000202768 (2000-07-01), None
patent: 2003011054 (2003-01-01), None
patent: 2003039319 (2003-02-01), None
Appl. Phys. A 77,923-932 (2003) “On the advanced lapping process in the precision finishin of thin-film magnetic recording heads for rigid disc drives”.
IEEE Mag-37 n.2, pp. 974.ff “The effect of Lapping Method on the Thermal Reliability of a GMR Head Based on Black's Equation”.
IEEE Mag-37 n.4, pp. 1713.ff “Resistance Measurement of GMR Heads as a Magnetic Performance Indicator”.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for evaluating the quality of a lapping plate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for evaluating the quality of a lapping plate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for evaluating the quality of a lapping plate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4291511

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.