Apparatus for etching wafer by single-wafer process

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With gas inlet structure

Reexamination Certificate

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Details

C156S345550, C156S345170, C134S153000, C134S902000

Reexamination Certificate

active

07488400

ABSTRACT:
An apparatus for etching a wafer by a single-wafer process comprises a fluid supplying device which feeds an etching fluid on a wafer, and a wafer-chuck for horizontally holding the wafer. The wafer-chuck is equipped with a gas injection device for injecting a gas to the wafer, a first fluid-aspirating device, and a second fluid-aspirating device. The etching fluid supplied on the wafer is spread by a rotation of the wafer. The etching fluid is scattered by a centrifugal force, or flows down over an edge portion of the wafer and is blown-off by the gas injected from the gas injection unit, and is aspirated by the first fluid-aspirating device or the second fluid-aspirating device.

REFERENCES:
patent: 4968375 (1990-11-01), Sato et al.
patent: 6159288 (2000-12-01), Satou et al.
patent: 2007/0087568 (2007-04-01), Koyata et al.
patent: 11-289002 (1999-10-01), None

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