Electricity: measuring and testing – A material property using electrostatic phenomenon – In a liquid
Patent
1992-07-31
1994-07-12
Strecker, Gerard R.
Electricity: measuring and testing
A material property using electrostatic phenomenon
In a liquid
G01N 2760
Patent
active
053292367
ABSTRACT:
An apparatus for detecting an electrostatic force in a solution includes a sample and a cantilever. An end of the cantilever is conductive and has voltage applied to it. The apparatus detects electrostatic interaction caused by functional groups of target molecules in the solution.
REFERENCES:
patent: 3753373 (1973-08-01), Brown
patent: 4448059 (1984-05-01), Kondo et al.
patent: 4794797 (1989-01-01), Ogawa
patent: 4861990 (1989-08-01), Coley
IBM Technical Disclosure Bulletin, vol. 24, No. 10, pp. 5150-5151, Mar., 1982, D. W. Ormond, Jr., "Dielectric Defect Detector".
Journal of Vacuum Science & Technology, vol. 9, No. 2, pp. 703-706, Mar., 1991, D. W. Abraham, et al., "Lateral Dopant Profiling in Semiconductors By Force Microscopy Using Capacitive Detection".
Science, vol. 251, S. Manne, et al., pp. 183-186, Jan. 11, 1991.
"Atomic-Resolution Electrochemistry With the Atomic Force Microscope . . . ".
Appl. Physics. Lett. 58(25), pp. 2921-2923, 1991, M. Nonnenmacher, et al., "Kevin Probe Force Microscopy."
Gemma Nobuhiro
Ishino Takashi
Edmonds Warren S.
Kabushiki Kaisha Toshiba
Strecker Gerard R.
LandOfFree
Apparatus for estimating charged and polarized states of functio does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for estimating charged and polarized states of functio, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for estimating charged and polarized states of functio will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-399374