Dynamic magnetic information storage or retrieval – Head – Magnetoresistive reproducing head
Reexamination Certificate
2006-08-15
2006-08-15
Watko, Julie Anne (Department: 2653)
Dynamic magnetic information storage or retrieval
Head
Magnetoresistive reproducing head
C360S324120
Reexamination Certificate
active
07092220
ABSTRACT:
A method and apparatus for enhancing thermal stability, improving biasing and reducing damage from electrical surges in self-pinned abutted junction heads. A first self-pinned layer having a first magnetic orientation is provided, wherein the first self-pinned layer has a first end, a second end and central portion. A second self-pinned layer is formed over only the central portion of the first self-pinned layer and an interlayer is disposed between the first and second self-pinned layers. A free layer is formed in a central region over the second self-pinned layer. First and second hard bias layers are formed over the first and second ends of the first self-pinned layer respectively, the first and second hard bias layer abutting the free layer, the first and second end of the first self-pinned layer extending under the hard bias layers at the first and second ends.
REFERENCES:
patent: 5018037 (1991-05-01), Krounbi et al.
patent: 5583725 (1996-12-01), Coffey et al.
patent: 6146776 (2000-11-01), Fukuzawa et al.
patent: 6252750 (2001-06-01), Gill
patent: 6324037 (2001-11-01), Zhu et al.
patent: 6344953 (2002-02-01), Kautzky et al.
patent: 6348274 (2002-02-01), Kamiguchi et al.
patent: 6385017 (2002-05-01), Min et al.
patent: 6433972 (2002-08-01), Mao et al.
patent: 6927952 (2005-08-01), Shimizu et al.
patent: 2001/0004798 (2001-06-01), Gill
patent: 2001/0026425 (2001-10-01), Miyazawa et al.
patent: 2001/0030887 (2001-10-01), Ishikawa et al.
patent: 2002/0024780 (2002-02-01), Mao et al.
patent: 2002/0085323 (2002-07-01), Smith et al.
patent: 2002/0149889 (2002-10-01), Gill
patent: 2002/0154455 (2002-10-01), Lenssen
patent: 2002/0154456 (2002-10-01), Carey et al.
patent: 2002/0154457 (2002-10-01), Horng et al.
patent: 2003/0002226 (2003-01-01), Lin et al.
patent: 2004/0114284 (2004-06-01), Rachid et al.
patent: 2005/0007707 (2005-01-01), Gill
patent: 11045415 (1999-02-01), None
Oxford English Dictionary, 2ndEd. 1989, from OED online, Mar. 18, 2006.
Liao, C.C.; Ho, C.H.; Huang, R. -T.; Chen, F.-R.; Kai, J.J.; Chen, L.-C.: Lin, M.-T.; and Yao, Y.D., “Thermal Stability Study of the Insulator Layer in NiFe/CoFe/Al2O3/Co Spin-Dependent Tunnel Junction,”Journal of Magnetism and Magnetic Materials, vol. 239, No. 1-3, pp. 116-119, Feb. 2002.
Cardoso, S.; Freitas, P.P.; de Jesus, C.; and Soares, J.C., “High Thermal Stability Tunnel Junctions,”Journal of Applied Physics, vol. 87, No. 9, pp. 6058-6060, May 2000.
Cardoso, S.; Freitas, P.P.; Zhang, Z.G.; Wei, P.; Barradas, N.; and Soares, J.C., “Electrode Roughness and Interfacial Mixing Effects on the Tunnel Junction Thermal Stability,”Journal of Applied Physics, vol. 89, No. 11, pp. 6650-6652, Jun. 2001.
Takahashi, M., Maeda, T., Inage, K., Sakai, M., Morita, H., and Matsuzaki, M., “EDS Induced Pinned Layer Reversal in Spin-Valve GMR Heads,”IEEE Transactions on Magnetics, vol. 34, No. 4, Jul. 1998.
Hung, Silas T., Wong, C.Y., Osborn, Mark, Kagaoan, Joel, Zhang, L.Z., and Bordeos, Randy, “A Study of GMR Read Sensor Induced by Soft EDS Using Magnetoresistive Sensitivity Mapping (MSM).” Sep. 2001 EOS/ESD Symposium Proceedings pp. 175-181.
Gill Hardayal Singh
Hsiao Wen-Chien
Luo Jih-Shiuan
Chambliss Bahner & Stophel P.C.
Hitachi Global Storage Technologies
Lynch David W.
Watko Julie Anne
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