Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Patent
1990-02-23
1993-06-01
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
356318, G01J 330, G01N 2163, G01N 2167
Patent
active
052164829
ABSTRACT:
Apparatus for emission spectrochemical analysis of a sample containing elements to be analyzed, wherein the sample is cyclically excited with relatively high energy to vaporize the sample elements and successively with relatively low energy to cause the vaporized elements to emit light containing spectral lines characteristic of the elements, which spectral lines are detected by a plurality of photomultiplier tubes corresponding to the spectral lines, with a common negative high-voltage source connected to the dynodes of the photomultiplier tubes. The negative high-voltage source is controlled in such a manner that it supplies a negative high voltage to the dynodes of the photomultiplier tubes to activate the tubes only during the low-energy excitation of the sample.
REFERENCES:
patent: 3531202 (1970-09-01), Wilkinson et al.
patent: 4393327 (1983-07-01), Walters et al.
patent: 4898466 (1990-02-01), Fukui et al.
Bhaumik et al, "Stroboscopic Time-Resolved Spectroscopy", The Review of Scientific Instruments, vol. 36, #1, Jan. 1965, pp. 37-40.
Anon, "New Laser Microspectral Analyzer", Monthly Technical Review, vol. 20, #1, pp. 8-9, Jan. 1986.
Technical Digest, No. 35, Jul. 1974, Western Electric; T. H. Briggs et al.: "Direct Reading Laser Spectrometer", pp. 9-10.
Fukui Isao
Hayashi Shuzo
Evans F. L.
Hantis K. P.
Shimadzu Corporation
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