Apparatus for EMC testing of electrical devices

Details Apparatus for EMC testing of electrical devices Apparatus for EMC testing of electrical devices

1996-11-22

1999-08-24

Ballato, Josie

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324628, 324632, 333 4, 333 5, 333 26, G01R 3100

Patent

active

059429038

ABSTRACT:
In an apparatus for EMC testing of electrical devices, conductors are arranged at opposite sides of a chamber of conductive material at a spacing from and parallel to the chamber walls. These conductors form a symmetrical double line and are fed out of phase at one end by a radio frequency source. They are electrically connected to the chamber walls at the other end via terminating impedances.

REFERENCES:
patent: 2446195 (1948-08-01), Shive
patent: 5237283 (1993-08-01), Carbonini
patent: 5285164 (1994-02-01), Wong
patent: 5436603 (1995-07-01), Fischer
Eighth International Conference on Electromagnetic Compatibility, Sep. 21-24, 1992, organized by the Electronics Division of the Institution of Electrical Engineers; L. Carbonini, A Shielded Multi-Wire Transmission Line for Susceptibility Measurements with Horizontally Polarized Electric Field, pp. 33-38.
IEEE Transactions on Instrumentation and Measurement, vol. IM-26, No. 3, Sep. 1977, M. L. Crawford et al, Generation of EM Susceptibility Test Fields Using a Large Absorber-Loaded TEM Cell, pp. 225-230.
Technische Mitteilungen des RFZ--28, vol. 1, Jan. 1994, Werner Wunderlich et al, Storfestgkeitsmessungen an Einrichtungen zur Drahtlosen Nachrichtenubertragung mit Relativ Grossen Abmessuugen, pp. 20-23.
COMTEST G-STRIP-- RF Test Systems for Global EMC Standard--Thermo Voltek, a Thermo Electron Company, (Jan. 1995), pp. 1-6.

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