Apparatus for drop testing and method utilizing the same

Details Apparatus for drop testing and method utilizing the same Apparatus for drop testing and method utilizing the same

2011-03-29

2011-03-29

Caputo, Lisa M (Department: 2855)

Measuring and testing

Testing by impact or shock

Accelerated or decelerated specimen

Reexamination Certificate

active

07913539

ABSTRACT:
An apparatus for drop testing is disclosed. The apparatus has a drop angle setting jig that horizontally moves on a support frame and positions a test object at a predetermined angle by clamping with a fixture. The jig provides a second datum plane and is connected to a moveable holding frame, with the holding frame providing a first datum plane. After the fixture clamps the testing object, the jig can be pulled back without touching the testing object, and the testing object stays still. Therefore, the testing object can be precisely positioned. Furthermore, with the sliding track and the stopping block, the jig is able to quickly return back to the reference position.

REFERENCES:
patent: 4910995 (1990-03-01), Nishio
patent: 7222515 (2007-05-01), Hatanaka et al.
patent: 2008/0289395 (2008-11-01), Torng et al.

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