Apparatus for device qualification

Details Apparatus for device qualification Apparatus for device qualification

1998-02-03

2000-09-26

Assouad, Patrick

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

702 81, 702118, B07C 5344, H05K 1300

Patent

active

061253367

ABSTRACT:
A batch of devices is installed in a handler of a tester. A known qualification test is executed on the batch of devices to determine a first resultant binout. The resultant binout for the batch is stored. Without displacing the devices, a trial qualification test is executed on the batch of devices in the handler of the tester to determine a second resultant binout. The first resultant binout is compared to the second resultant binout for each device of the batch of devices. For example, each device may be categorized as either a correlating part, an upgraded part or a downgraded part.

REFERENCES:
patent: 5030905 (1991-07-01), Figal
patent: 5538141 (1996-07-01), Gross, Jr. et al.
patent: 5603412 (1997-02-01), Gross, Jr. et al.
patent: 5798653 (1998-08-01), Leung, Jr.
patent: 5822256 (1998-10-01), Bauer et al.
patent: 5867505 (1999-02-01), Beffa
patent: 5895443 (1999-04-01), Gross, Jr. et al.

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