Apparatus for determining wall thickness of microcapsule

Details Apparatus for determining wall thickness of microcapsule Apparatus for determining wall thickness of microcapsule

2007-10-09

2007-10-09

Toatley, Jr., Gregory J. (Department: 2886)

Optics: measuring and testing

Dimension

Thickness

Reexamination Certificate

active

10792869

ABSTRACT:
A thickness-determining apparatus for determining a wall thickness of a microcapsule having a refractive index n1comprises a sensor1for detecting a light scattering intensity data I1with respect to the microcapsule dispersed in a medium having a refractive index n1, and a light scattering intensity data I2with respect to the microcapsule dispersed in a medium having a refractive index n2; a memory circuit3for storing a theoretical equation correlating a light scattering intensity characteristic with a particle size; and an arithmetic circuit5for calculating an inner diameter r1and an outer diameter r2from the theoretical equation based on the light scattering intensity data I1and I2, and calculating the wall thickness.

REFERENCES:
patent: 4565449 (1986-01-01), Grego
patent: 6538755 (2003-03-01), Propst, Jr.
patent: 6919954 (2005-07-01), Sasaki et al.
Toshiaki Dobashi et al.,Langmuir, vol. 14, (1998), pp. 745-749.

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