Thermal measuring and testing – Determination of inherent thermal property
Patent
1995-07-31
1997-09-09
Gutierrez, Diego F. F.
Thermal measuring and testing
Determination of inherent thermal property
374 44, 364556, G01N 2520, G01N 2518
Patent
active
056648847
ABSTRACT:
This invention involves apparatus for determining the thermal resistivities W.sub.s (=1/.kappa..sub.s) of electrically insulating, crystalline or polycrystalline samples under test (SUTs), all comprising host material such as CVD diamond. Once the optical absorptivities .alpha..sub.1 and .alpha..sub.2 and the thermal resistivities W.sub.1 and W.sub.2 of at least two other crystalline or polycrystalline bodies B.sub.1 and B.sub.2, respectively, comprising the same host material as the SUTs, and containing the same type of impurity or combination of impurities as the SUTs, are measured by some other technique--the inventive apparatus can then determine the thermal resistivities W.sub.s of the SUTs rather quickly from a measurement only of the optical absorptivities a.sub.s of the SUTs. These determinations of the thermal resistivities W.sub.s of the SUTs rely on our discovery that the following linear relationship exists: W=A+C.alpha., where A and C are constants so long as the type of impurity or combination of impurities in all the bodies B.sub.1, B.sub.2, and SUTs is the same, even though the impurities or combination of impurities have different concentrations in the bodies B.sub.1 and B.sub.2, as well as in the SUTs.
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Graebner John Edwin
Jin Sung-ho
Caplan David I.
Gutierrez Diego F. F.
Lucent Technologies - Inc.
Pacher Eugen E.
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