Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1984-03-26
1985-11-19
Punter, William H.
Optics: measuring and testing
By polarized light examination
With light attenuation
250223R, 250561, 356385, G01B 1104, G01B 1114
Patent
active
045538433
ABSTRACT:
Apparatus for determining the alignment of leads extending from a body of an integrated circuit package, including an optical system for producing data having information of the spacing between the leads and a data processor for determining the spacing between the leads in response to the data. A package handler sorts the package under control by the data processor.
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Hojaboom et al, "Automatic Inspection System", IBM Tech. Disc. Bull., 4-1979, pp. 4426-4427.
Brekka Thomas T.
Langley Dennis C.
Micro Component Technology, Inc.
Nawrocki Lawrence M.
Punter William H.
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