Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Field effect device in non-single crystal – or...
Reexamination Certificate
2005-12-13
2005-12-13
Zarabian, Amir (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Field effect device in non-single crystal, or...
C257S059000, C257S222000, C257S225000, C257S232000, C257S233000, C257S234000, C257S257000, C257S291000, C257S292000, C257S293000, C257S294000, C257S431000, C257S432000, C257S443000, C257S467000
Reexamination Certificate
active
06974973
ABSTRACT:
An imager temperature sensor and a current correction apparatus are provided which use dark pixel measurements from an imager chip during operation together with a fabrication process constant as well as a chip dependent constant to calculate chip temperature. The chip temperature may be used to generate a current correction signal. The correction signal is used to tune a current on the imager chip to correct for temperature variations.
REFERENCES:
patent: 4739495 (1988-04-01), Levine
patent: 4862237 (1989-08-01), Morozumi
patent: 5008739 (1991-04-01), D'Luna et al.
patent: 5047863 (1991-09-01), Pape et al.
patent: 5452001 (1995-09-01), Hosier et al.
patent: 5886353 (1999-03-01), Spivey et al.
patent: 5929689 (1999-07-01), Wall
patent: 5953060 (1999-09-01), Dierickx
patent: 6101287 (2000-08-01), Corum et al.
patent: 6144408 (2000-11-01), MacLean
patent: 6303923 (2001-10-01), Wadsworth et al.
patent: 6330345 (2001-12-01), Russo et al.
patent: 6418241 (2002-07-01), Schreiner
patent: 6483116 (2002-11-01), Kozlowski et al.
patent: 6607301 (2003-08-01), Glukhovsky et al.
patent: 2001/0011736 (2001-08-01), Dierickx
patent: 2002/0098609 (2002-07-01), Ono et al.
patent: 2003/0202111 (2003-10-01), Park
patent: 2004/0032518 (2004-02-01), Benjamin et al.
AN03: Guide to Image Quality and Pixel Correction Methods, Rad-icon Imaging Corp.
Anton Bakker and Johan H. Huijsing; Micropower CMOS Temperature Sensor with Digital Output, IEEE Journal of Solid State Circuits, vol. 31, No. 7, Jul. 1996, pp. 933-937.
Karim Arabi and Bozena Kaminska, Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures, Proceedings of the 1997 International Conference on Computer Design (ICCD '97), pp. 462-467.
Louis Luh, John Choma, Jr., Jeffrey Draper, Herming Chiueh, A High-Speed CMOS On-Chip Temperature Sensor, Proceedings of the European Solid State Circuits Conference, Sep. 1999, pp. 290-293.
V. Szekely, M. Rencz and B. Courtois, Integrating On-Chip Temperature Sensors into DIT Schemes and BIST Architectures, Proceedings of the 15th IEEE VLSI Test Symposium, IEEE, (1997), pp. 440-445.
M. Loose, K. Meier, J. Schemmel, Self-calibrating logarithmic CMOS image sensor with single chip camera functionality, Contribution to IEEE CCD & AIS workshop, Karuizawa, Japan (1999) R27.
Hon-Sum Wong, Technology and Device Scaling Considerations for CMOS Imagers, IEEE Transactions on Electron Devices, vol. 43, No. 12, Dec. 1996, pp. 2131-2142.
Eric R. Fossum, Digital Camera System on a Chip, IEEE Micro, May-Jun. 1998, pp. 8-15.
C. C. Lui and C. H. Mastrangelo, CMOS Uncooled Heat-Balancing Infrared Imager, IEEE Journal of Solid-State Circuits, Apr. 2000, pp. 1-9.
Agranov Gennadiy A.
Rossi Giuseppe
Dickstein , Shapiro, Morin & Oshinsky, LLP
Micro)n Technology, Inc.
Soward Ida M.
Zarabian Amir
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