Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1989-10-23
1991-02-19
Westin, Edward P.
Optics: measuring and testing
By polarized light examination
With light attenuation
250560, G01B 1124, G01N 2186
Patent
active
049938355
ABSTRACT:
Disclosed is an apparatus for detecting the three-dimensional configuration of an object employing an optical cutting method. A light projector pulse-flashes slit-shaped light and causes the light to scan an object at a predetermined speed. An image sensor having a plurality of pixels is disposed in opposition to the object. An optical system forms on the image sensor an image of an optical cutting line formed on the surface of the object by the light. A difference detector detects the difference between the on- and off- levels of each of pulses of the image detected by the pixels of the sensor. A time calculator calculates the time at which the image has passed each of the pixels, on the basis of the difference detected by the difference detector. A configuration calculator calculates the three-dimensional configuration of the object on the basis of the calculated passage time and the scanning speed of the slit-shaped light. Since the difference between the levels of each pulse of the image is obtained, any optical signals resulting from a factor other than the pertinent pulses, such as influence by the background of the object, or a flash can be excluded, and the configuration can be detected with a high level of precision.
REFERENCES:
patent: 4794262 (1988-12-01), Sato et al.
Inoue Yasuo
Nishimura Tadashi
Mitsubishi Denki & Kabushiki Kaisha
Pham Hoa
Westin Edward P.
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