Geometrical instruments – Gauge – Coordinate movable probe or machine
Reexamination Certificate
2006-10-03
2006-10-03
Gutierrez, Diego (Department: 2859)
Geometrical instruments
Gauge
Coordinate movable probe or machine
C033S706000, C033S0010MP, C033S556000
Reexamination Certificate
active
07114265
ABSTRACT:
The invention is directed to a device for direct detection of the spatial position of a probe element in a multi-coordinate measuring apparatus, with a reference system comprised of at least one first standard and one second standard that are associated with coordinate axes of the measuring apparatus. The first standard is a planar standard with a line grating array. The second standard is non-contacting relative to the first standard and movable in two dimensions by means of a cross slide. Provision is made for a first position measuring system for determining the spatial position of the second standard with respect to the first standard, and for a second position measuring system for determining the spatial position of a carriage carrying a three-dimensional probe assembly, with respect to the second standard. The device forms in an associated multi-coordinate measuring apparatus a continuous measuring chain from the first standard to the tip of the probe element. This supplies directly a measurement result considering any guide inaccuracies, without the need to perform any path corrections.
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Klingelnberg, “Verzahnungsmesszentren Klingelnberg P 65/ P100”, pp. 1-16.
Cohen Amy R.
Gutierrez Diego
Klingelnberg GmbH
McCormick Paulding & Huber LLP
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