Apparatus for detecting the displacements of points of excited s

Details Apparatus for detecting the displacements of points of excited s Apparatus for detecting the displacements of points of excited s

1982-03-09

1985-07-02

Willis, Davis L.

Optics: measuring and testing

Material strain analysis

By light interference detector

73657, 356358, G01B 902

Patent

active

045264651

ABSTRACT:
An apparatus for detecting the displacements of points of structures which are excited either by artificially or naturally produced forces comprises, in combination:

REFERENCES:
patent: 3471238 (1969-10-01), Hawke
patent: 3854325 (1974-12-01), Coate
patent: 4123166 (1978-10-01), Botcherby et al.
patent: 4123167 (1978-10-01), Botcherby et al.
patent: 4170397 (1979-10-01), Botcherby et al.
Denby et al., "Plane-Surface Strain Examination by Speckle-Pattern Interferometry, Using Electronic Processing", J. Strain Analysis vol. 9, No. 1, pp. 17-25, 1974.
Schwiesow et al., "Coherent Differential Doppler Measurements of Transverse Velocity at a Remote Point", Applied Optics, vol. 16, No. 5, pp. 1145-1150, 5/77.
Vanetsian et al., "Laser Apparatus for Measuring . . . " Soviet Journal of Quantum Electronics, vol. 1, No. 1, pp. 331-335, Feb. 1972.
Dandliker et al., "Measuring Micro-Vibrations by Heteroclyne Speckle Interferometry", Proc. SPIE, vol. 236, pp. 83-85, 1980.

Affiliated with

Also associated with

Rating

Apparatus for detecting the displacements of points of excited s does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for detecting the displacements of points of excited s, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for detecting the displacements of points of excited s will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-378562