Electricity: motive power systems – Braking – Automatic and/or with time-delay means
Patent
1995-02-01
1996-09-24
Warden, Jill
Electricity: motive power systems
Braking
Automatic and/or with time-delay means
250237G, 25023116, G01B 902
Patent
active
055596002
ABSTRACT:
The apparatus disclosed herein employs a grating or scale which concentrates light at a preselected wavelength into the positive and negative first orders while minimizing the zeroth order. The scale is illuminated with monochromatic light of the selected wavelength and a poly-phase periodic detector has its sensing plane spaced from the scale a distance less than ##EQU1## where W is the width of the illuminated region of the scale. The period of the poly-phase detector is equal to P/2 so that each detector element or phase responds principally to interference between the positive and negative first orders without requiring magnification or redirection of the diffracted light. Preferably, the distance of the sensing plane from the scale is greater than ##EQU2## so that the detector response does not include substantial components from diffraction orders higher than the first.
REFERENCES:
patent: Re33669 (1991-08-01), Nomura et al.
patent: 4168908 (1979-09-01), Cubalchini
patent: 4176276 (1979-11-01), Kaul et al.
patent: 4631416 (1986-12-01), Tratna, Jr.
patent: 4639863 (1987-01-01), Harrison et al.
patent: 4655587 (1987-04-01), Wijntjes et al.
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 4703176 (1987-10-01), Hahn et al.
patent: 4710026 (1987-12-01), Magone et al.
patent: 4711573 (1987-12-01), Wijntjes et al.
patent: 4728193 (1988-03-01), Bartelt et al.
patent: 4731772 (1988-03-01), Lee
patent: 4764014 (1988-08-01), Makosch et al.
patent: 4776698 (1988-10-01), Crosdale
patent: 4776701 (1988-10-01), Pettigrew
patent: 4815850 (1989-03-01), Kanayama et al.
patent: 4829342 (1989-05-01), Nishimura
patent: 4868385 (1989-09-01), Nishimura
patent: 4870635 (1989-09-01), Block et al.
patent: 4872751 (1989-10-01), Hercher
patent: 4967072 (1990-10-01), Nishimura
patent: 4970388 (1990-11-01), Nishimura et al.
patent: 5036192 (1991-07-01), Ishizuka et al.
patent: 5043775 (1991-08-01), Lee
patent: 5050153 (1991-09-01), Lee
patent: 5066130 (1991-11-01), Tsukiji et al.
patent: 5098190 (1992-03-01), Wijntjes et al.
patent: 5104225 (1992-04-01), Masreliez
patent: 5108184 (1992-04-01), Brown et al.
patent: 5121371 (1992-06-01), Farnsworth et al.
patent: 5129725 (1992-07-01), Ishizuka et al.
patent: 5136152 (1992-08-01), Lee
patent: 5159408 (1992-10-01), Waldenmaier et al.
patent: 5162955 (1992-11-01), Burdenko
patent: 5179485 (1993-01-01), Tamayama
patent: 5182610 (1993-01-01), Shibata
patent: 5196970 (1993-03-01), Seko et al.
patent: 5227930 (1993-07-01), Thanos et al.
patent: 5325349 (1994-06-01), Taniguchi
Alfons Ernst, Digital Linear and Angular Metrology, 2d ed. 1992 (translation by Robert W. Brown, Robert Franks, Herber Uhtenwoldt), pp. 17-19.
Hoetron Advertisement, Dr. Wai-Hon Lee, "A Simpler Test for Wavefront Quality," Photonics Spectra, Nov. 1992, p. 201.
G. N. Rassudova and F. M. Gerasimov, "The Use of Reflection Diffraction Gratings in Interference Systems for Measuring Linear Shifts. II," Optical Spectroscope, vol. 14, No. 215, (1963), pp. 295-300.
Michael Hercher and Geert Wyntjes, "Precision Angle Measurement With a Two-Frequency HeNe Laser,", Proceedings of SPIE-The International Society for Optical Engineering, Jan. 15-16, 1987, Vo. 741, pp. 174-185.
Lawrence Mertz, "Optical homodyne phase metrology," Applied Optics, vol. 28, No. 5, Mar. 1, 1989, pp. 1011-1014.
Lawrence Mertz, "Complex Interferometry", Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1530-1534.
Lawrence Mertz, "Real-time Fringe-Pattern Analysis", Applied Optics, vol. 22, No. 10, May 15, 1983, pp. 1535-1539.
Lawrence Mertz, "Phase Estimation with Few Photons," Applied Optics, vol. 23, No. 10, May 15, 1994, pp. 1638-1641.
Sharp Corporation Japan brochure, "Laser Diodes,", Mar. 1992.
Le Long V.
MicroE, Inc.
Warden Jill
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