Apparatus for detecting noise in the measurement of very small r

Details Apparatus for detecting noise in the measurement of very small r Apparatus for detecting noise in the measurement of very small r

1989-07-26

1990-05-29

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324133, 340661, G01R 2700

Patent

active

049298860

ABSTRACT:
A pair of a first and a second R-C integrating circuits connected in series. A first switch S.sub.1 supplies a first combined voltage E.sub.1 +E.sub.3 of a first positive threshold voltage E.sub.1 and a positive initial set up voltage E.sub.3 to a first capacitor in the first R-C circuit, and a second switch S.sub.2 supplies a second capacitor with a second combined voltage of a second positive threshold voltage E.sub.2 with a negative initial set up voltage -E.sub.4. The switches S.sub.1 and S.sub.2 are closed before the input of the signal to be measured. The switches are opened after the input of the signal. A first comparator compares a first discharged voltage output from the first capacitor and the first threshold voltage E.sub.1, and a second comparator compares a second discharged voltage output from the second capacitor and the second threshold voltage E.sub.2. A logic circuit is connected to the output terminals of the first and second comparators, respectively, and determine in conjunction with a timing circuit whether the first and second discharged voltages are within a range between the first threshold voltage E.sub.1 and second threshold voltage E.sub.2 within a predetermined time period of the input of the signal to be measured, so as to provide an indication to judge the right time for resistance measurements.

REFERENCES:
patent: 3947760 (1976-03-01), Noguchi et al.
patent: 4068165 (1978-01-01), Labinsky et al.
patent: 4743836 (1988-05-01), Grzybowski et al.
patent: 4761639 (1988-08-01), Pyke et al.

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