Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-08-24
1998-04-28
Brown, Glenn W.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324539, G01R 3102
Patent
active
057449678
ABSTRACT:
A latching tester for testing continuity of wires in a system has an array of pin electronics cells, where each pin cell couples a signal to a row sense line and a column sense line when a change in current flow through a pin occurs; apparatus for detecting the signal on the row sense line; and apparatus for detecting the signal on the column sense line. The array of pin electronics cells may also operate as a capacitively coupled neural network, where a signal coupled onto the row and column lines from a stimulus line varies with the load on each pin of the pin electronics cells. An alternate mode of operation permits stimulus of the network and attached loads, and generation of a signature based upon the response of the network to the stimulus, as observed on the row and column sense lines. In yet another mode of operation, the tester may serve to recognize particular signals.
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patent: 5187680 (1993-02-01), Engeler
patent: 5218440 (1993-06-01), Mathur
"Introducing Analysis Tech", Anatech, pp. 1-10 (no date available).
Neural Computing, NeuralWorks Professional II/Plus and NeuralWorks Explorer, NeuralWare in 1991, pp. NC4-NC7 (no month available).
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