Image analysis – Applications – Personnel identification
Reexamination Certificate
2007-03-01
2010-12-07
Chang, Jon (Department: 2624)
Image analysis
Applications
Personnel identification
C382S154000, C382S201000, C382S132000
Reexamination Certificate
active
07848547
ABSTRACT:
An apparatus for detecting a feature point includes an image input unit that inputs an image of the target object; a three-dimensional shape information holding unit that stores three-dimensional shape information including reference feature points of a model relating to the target object; a correspondence relation acquiring unit that acquires a correspondence relation between the input image and the three-dimensional shape; a seek area acquiring unit that acquires image information of a seek area on the input image corresponding to an area including a point corresponding to the specific feature point in the model on the basis of the correspondence relation; and a feature point detecting unit that detects the position of the specific feature point in the input image from the image information.
REFERENCES:
patent: 5805745 (1998-09-01), Graf
patent: 5982912 (1999-11-01), Fukui et al.
patent: 5995639 (1999-11-01), Kado et al.
patent: 6072893 (2000-06-01), Luo et al.
patent: 6580821 (2003-06-01), Roy
patent: 2005/0265604 (2005-12-01), Yuasa
patent: 2006/0269143 (2006-11-01), Kozakaya
patent: 2007/0080967 (2007-04-01), Miller
patent: 2007/0183665 (2007-08-01), Yuasa et al.
patent: 2007/0258645 (2007-11-01), Gokturk et al.
patent: 2008/0137934 (2008-06-01), Sakaguchi et al.
patent: 02-073471 (1990-03-01), None
patent: 09-251534 (1997-09-01), None
patent: 10-86696 (1998-04-01), None
patent: 3279913 (2002-02-01), None
patent: 2003-141552 (2003-05-01), None
patent: 2003-187247 (2003-07-01), None
patent: 2004-265267 (2004-09-01), None
Yuasa et al., “Face Feature Point Detecting Device and Method”, U.S. Appl. No. 11/524,270, filed Sep. 21, 2006.
Notification of Reasons for Refusal for Application No. 2006-061917, the Japanese Patent Office, mailed May 25, 2010.
Kozakaya Tatsuo
Nishiura Masahide
Takeguchi Tomoyuki
Yamaguchi Osamu
Yuasa Mayumi
Chang Jon
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
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