Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1989-05-15
1991-01-29
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
174115, 174120SC, 324509, 324522, G01R 3102
Patent
active
049889494
ABSTRACT:
An apparatus for detecting excessive chafing of a cable arrangement against an electrically grounded structure includes a layer of semiconductive material positioned in surrounding relation with an elongated member such as an electrical cable, tube or hose. A layer of electrically insulating material surrounds the layer of semiconductive material. A detector circuit is electrically connected with a reference end portion of the semiconductive layer. The detector circuit is operable to detect at least momentary contact between the layer of semiconductive material and an electrically grounded structure due to erosion of the layer of electrically insulating material surrounding the semiconductive layer caused by excessive chafing of the layer of electrically insulating material against the ground structure. The detector circuit is further operable to provide an indication of the distance measured along the layer of semiconductive material between the reference end portion of the semiconductive layer and the location at which the layer of semiconductive material has at least momentarily contacted the electrically grounded structure.
REFERENCES:
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patent: 3727128 (1973-04-01), McFerrin
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patent: 4301399 (1981-11-01), Miller et al.
patent: 4859989 (1989-08-01), McPherson
Boenning Robert A.
White, Jr. Harvey H.
Eisenzopf Reinhard J.
Mueller Robert
Spadacene Joseph C.
Westinghouse Electric Corp.
Williamson John K.
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