Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-01-15
2008-01-15
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07319526
ABSTRACT:
A displacement detection apparatus (100) includes a main scale (110) and a detection head (120). The detection head (120) includes a light emission/reception unit (130) and an optical device unit (140). The optical device unit (140) has a first diffraction scale (141) and a second diffraction scale (143). The first diffraction scale (141) has a transmission type first diffraction grating (142). The second diffraction scale (143) has a diffraction grating. The second diffraction scale (143) has a transmission type second diffraction grating (144) on both sides of a metal film (146). Furthermore, the metal film (146) configures a reflection type third diffraction grating (145) when the second diffraction scale (143) is viewed from the side of the main scale (110).
REFERENCES:
patent: 5214280 (1993-05-01), Rieder et al.
patent: 5696373 (1997-12-01), Fukui et al.
patent: 0 672 891 (1995-09-01), None
patent: 06194190 (1994-07-01), None
patent: A 2002-372407 (2002-12-01), None
Chowdhury Tarifur
Cook Jonathon D
Mitutoyo Corporation
Oliff & Berridg,e PLC
LandOfFree
Apparatus for detecting displacement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for detecting displacement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for detecting displacement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2811722