Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1975-01-30
1976-11-16
Corbin, John K.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
250572, 350271, 350274, 356209, G01N 2132
Patent
active
039921115
ABSTRACT:
Apparatus for detecting defect locations at the surface of a moving reflecting material comprising a light source and a first optical system which directs the light thereof successively upon surface regions of the material situated along a line extending essentially transversely to the direction of movement of the material. A photoelectric transducer and a second optical system are provided, the second optical system collecting the light reflected from the individual surface regions at the transducer. An indicator device or mechanism which as a function of the intensity of the light reflected by each surface region produces a signal, especially an optical signal, which is associated with the relevant surface region. According to the invention the light source is a laser light source, the first optical system splits up the laser beam into an essentially two-dimensional parallel bundle of rays, the plane of which intersects the surface of the material to be examined approximately perpendicularly and which grazingly impinges upon the material surface, especially at an angle less than 5.degree., and that in the path of the rays of the light impinging upon the material there is arranged a movable diaphragm which periodically only frees individual partial regions of the planar bundle of rays.
REFERENCES:
patent: 1860967 (1932-05-01), Tate
patent: 2208420 (1940-07-01), Gulliksen
patent: 2246501 (1941-06-01), Bradner et al.
patent: 3052168 (1962-09-01), Reed
patent: 3202043 (1965-08-01), Galey et al.
patent: 3330961 (1967-07-01), Juengst et al.
patent: 3618063 (1971-11-01), Johnson et al.
patent: 3666370 (1972-05-01), Seasholtz
Kamber Walter
Roulier Alfred
Ciba-Geigy AG
Corbin John K.
Falber Harry
Jorda Karl F.
Rosenberger Richard A.
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