Apparatus for detecting and measuring defects

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356237, 250572, G01N 2172

Patent

active

044171498

ABSTRACT:
An apparatus for detecting and measuring the area of defects in a sheet or rolled material comprises a defect detection section which rapidly scans the whole area of the material to locate the positions of defects and a defect size measuring section which is moved directly to each of the located positions to measure the area of the defect.

REFERENCES:
patent: 3280692 (1966-10-01), Milnes et al.
patent: 3851972 (1974-12-01), Smith et al.
patent: 4330205 (1982-05-01), Murakami et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for detecting and measuring defects does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for detecting and measuring defects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for detecting and measuring defects will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1816785

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.