Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1987-08-13
1989-09-19
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
29721, 29759, 358101, B01B 1100
Patent
active
048675695
ABSTRACT:
Disclosed is an apparatus for detecting a position of an electronic part, the apparatus comprising first and second light source arranged so that an electronic part attracted by attraction means is sandwiched therebetween, a diffusion plate provided between the attraction means and the second light sources, and an imaging means provided below the diffusion plate. The light from the first light sources is irradiated on the electronic part and the transmission light from the electronic part is applied to the imaging means, or the light from the second light sources is irradiated on the electronic part and the reflected light is selectively applied to the imaging means through a through-hole of the diffusion plate to detect a position of the electronic part.
REFERENCES:
patent: 4575637 (1986-03-01), Sullivan, Jr.
patent: 4608494 (1986-08-01), Kobayashi et al.
patent: 4628464 (1986-12-01), McConnell
patent: 4747198 (1988-05-01), Asai et al.
patent: 4793707 (1988-12-01), Hata et al.
IBM Technical Disclosure Bulletin, vol. 24, No. 6--Nov. 1981, p. 2937.
Elektrotechnik, vol. 65, No. 20, Oct. 1983, pp. 76, 77.
Evans F. L.
Sanyo Electric Co,. Ltd.
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