Metal working – Barrier layer or semiconductor device making
Reexamination Certificate
2005-06-08
2008-08-12
Fourson, George (Department: 2823)
Metal working
Barrier layer or semiconductor device making
C359S626000, C359S638000, C250S492220, C250S492230
Reexamination Certificate
active
07410508
ABSTRACT:
Laser beams emitted by a plurality of laser sources are divided into a plurality of sub-beams, which are irradiated onto selected portions of an amorphous semiconductor on a substrate to crystallize the amorphous semiconductor. A difference in diverging angles between the laser beams is corrected by a beam expander. The apparatus includes a sub-beam selective irradiating system including a sub-beam dividing assembly and a sub-beam focussing assembly. Also, the apparatus includes laser sources, a focussing optical system, and a combining optical system. A stage for supporting a substrate includes a plurality of first stage members, a second stage member disposed above the first stage members, and a third stage member38C, rotatably disposed above the second stage to support an amorphous semiconductor.
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Sasaki Nobuo
Uzuka Tatsuya
Fourson George
Garcia Joannie A
Greer Burns & Crain Ltd.
Japan Laser Corporation
Sharp Kabushiki Kaisha
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