Apparatus for coupling a semiconductor device with a tester

Details Apparatus for coupling a semiconductor device with a tester Apparatus for coupling a semiconductor device with a tester

1996-12-02

1997-11-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324762, G01R 3102, G01R 1073

Patent

active

056916507

ABSTRACT:
A method for making and using a test fixture (10) for testing a packaged semiconductor device (44). The test fixture (10) includes a nonconductive housing (11) and a contactor assembly (30). The contactor assembly (30) has a contactor lead (31) and is removable from the housing (11). The contactor assembly (30) is mounted to the housing (11) such that the contactor lead (31) becomes interdigitated between upper cantilever structures (20) and lower cantilever structures (21). The test fixture (10) is coupled to a tester (46) which is between a first tool set (41) and a second tool set (42) of a trim and form apparatus (40). The packaged semiconductor device (44) is placed in contact with the test fixture (10) and tested.

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