Apparatus for controlling the scan width of a scanning laser bea

Details Apparatus for controlling the scan width of a scanning laser bea Apparatus for controlling the scan width of a scanning laser bea

1994-10-12

1996-10-22

Gonzalez, Frank

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, 372 29, G01B 902

Patent

active

055682553

ABSTRACT:
Swept-wavelength lasers are often used in absorption spectroscopy applications. In experiments where high accuracy is required, it is desirable to continuously monitor and control the range of wavelengths scanned (the scan width). A system has been demonstrated whereby the scan width of a swept ring-dye laser, or semiconductor diode laser, can be measured and controlled in real-time with a resolution better than 0.1%. Scan linearity, or conformity to a nonlinear scan waveform, can be measured and controlled. The system of the invention consists of a Fabry-Perot interferometer, three CAMAC interface modules, and a microcomputer running a simple analysis and proportional-integral control algorithm. With additional modules, multiple lasers can be simultaneously controlled. The invention also includes an embodiment implemented on an ordinary PC with a multifunction plug-in board.

REFERENCES:
patent: 4947398 (1990-08-01), Yasuda et al.
patent: 5353115 (1994-10-01), McIntyre
Schuda et al, "Direct Optical Measurement of Sodium Hyperfine Structure using a CW dye Laser and An Atomic Beam", Apr. 1973, applied physics, p. 360.

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